Technical Program

Paper Detail

Paper:FR-UA.1P.4
Session:Microwave to Millimeter Measurements and Standards
Location:America's Cup AB
Session Time:Friday, July 14, 13:20 - 17:00
Presentation Time:Friday, July 14, 14:20 - 14:40
Presentation: Oral
Paper Title: Measurement of High-Impedance Surface Backed Microstrip Structures Using Multimode TRL Calibration
Authors: Kevin Keegan, Kiersten Kerby-Patel, University of Massachusetts Boston, United States